Electrical characterization of thermomechanically stable YSZ membranes for micro solid oxide fuel cells applications

Solid State Ionics

Volumn 181, Issue 5-7, 2010, Pages 322-331

  Garbayo, I ^a   Tarancon A ^a,b   Santiso, J ^c   Peiro F ^d   Alarcon LLado E ^e   Cavallaro, A ^c   Gracia I ^a   Cane C ^a   Sabaté, Neus ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE BARCELONA   (Spain)

^b CATALONIA INSTITUTE FOR ENERGY RESEARCH IREC   (Spain)

^c CSIC   (Spain)

^d UNIVERSITY OF BARCELONA   (Spain)

^e INSTITUTE OF EARTH SCIENCES JAUME ALMERA   (Spain)

Author keywords

EIS; Free standing membrane; Micro SOFC; PLD; TEM; YSZ

Indexed keywords

AREA-SPECIFIC RESISTANCES; DC CONDUCTIVITY; DEPOSITION TEMPERATURES; ELECTRICAL CHARACTERIZATION; ELECTRICAL PROPERTY; EVOLUTION OF THE MICROSTRUCTURE; FREE STANDING MEMBRANES; IMPEDANCE SPECTROSCOPY; MECHANICALLY STABLE; MICRO DEVICES; MICRO SOFC; MICRO SOLID OXIDE FUEL CELLS; OPERATING TEMPERATURE; ORDER OF MAGNITUDE; POST-DEPOSITION; SILICON-BASED; TEM; TEM ANALYSIS; THERMO-MECHANICAL BEHAVIORS; WORKING CONDITIONS; X RAY MICRODIFFRACTION; YTTRIA-STABILIZED ZIRCONIA FILMS;

ELECTRIC PROPERTIES; ELECTROCHEMICAL CORROSION; MECHANICAL STABILITY; NICKEL OXIDE; PROGRAMMABLE LOGIC CONTROLLERS; PULSED LASER DEPOSITION; PULSED LASERS; SOLID OXIDE FUEL CELLS (SOFC); YTTRIA STABILIZED ZIRCONIA; YTTRIUM ALLOYS; ZIRCONIA;

MEMBRANES;

EID: 77649342304     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2009.12.019     Document Type: Article

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