Yttria-stabilized zirconia thin films by pulsed laser deposition: Microstructural and compositional control

Journal of the European Ceramic Society

Volumn 30, Issue 2, 2010, Pages 489-495

  Heiroth, S ^a   Lippert, T ^a   Wokaun, A ^a   Dobeli M ^a   Rupp, J L M ^b   Scherrer, B ^b   Gauckler, L J ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

Electrical conductivity; Films; Fuel cells; Microstructure final; YSZ

Indexed keywords

AMORPHOUS LAYER; COLUMNAR MICROSTRUCTURES; COMPOSITIONAL CONTROL; ELECTRICAL CONDUCTIVITY; FILM MICROSTRUCTURES; FLUENCE RANGE; FREE FILMS; LOW BACKGROUND; LOW-ACTIVATION ENERGY; MICRO-STRUCTURAL; MICROSTRUCTURE-FINAL; OXYGEN DEFICIENT; PLD PROCESS; POLYCRYSTALLINE LAYERS; PULSED LASER; ROOM TEMPERATURE; SAPPHIRE SINGLE CRYSTAL; THRESHOLD PRESSURES; YSZ; YSZ FILMS; YTTRIA-STABILIZED ZIRCONIA THIN FILMS;

ACTIVATION ENERGY; AMORPHOUS MATERIALS; CORUNDUM; CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY; FILM GROWTH; FRACTURE TOUGHNESS; FUEL CELLS; LASER ABLATION; LASERS; OXYGEN; PULSED LASER DEPOSITION; SINGLE CRYSTALS; STOICHIOMETRY; YTTRIA STABILIZED ZIRCONIA; ZIRCONIA;

DEPOSITION;

EID: 70350714746     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2009.06.012     Document Type: Article

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