Surface/interface-related conductivity in nanometer thick YSZ films

Electrochemical and Solid-State Letters

Volumn 7, Issue 12, 2004, Pages

  Kosacki, Igor ^a   Rouleau, Christopher M ^a   Becher, Paul F ^a   Bentley, James ^a   Lowndes, Douglas H ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRIC CONDUCTIVITY; FUEL CELLS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); IONIC CONDUCTION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PHASE EQUILIBRIA; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

ELECTRODE CONFIGURATION; IONIC TRANSPORT; LATTICE MISMATCH; OPTIMUM DOPING; YTTRIA-STABILIZED ZIRCONIA (YSZ) THIN FILMS;

ULTRATHIN FILMS;

EID: 10944274012     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1809556     Document Type: Article

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