A real time scale measurement of residual stress evolution during coating deposition using electric extensometry

Reviews on Advanced Materials Science

Volumn 7, Issue 1, 2004, Pages 32-40

  Carneiro, J O ^a   Teixeira, V ^a   Portinha, A ^a   Vaz, F ^a   Ferreira, J A ^a  

^a UNIVERSITY OF MINHO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGE CIRCUITS; DILATOMETERS; MAGNETRON SPUTTERING; RESIDUAL STRESSES; SENSITIVITY ANALYSIS; STRAIN GAGES; STRESS ANALYSIS; THERMAL STRESS;

ELECTRIC EXTENSOMETRY; RESIDUAL STRESS EVOLUTION; WHEATSTONE ELECTRIC BRIDGE CIRCUIT;

COATINGS;

EID: 4944267180     PISSN: 16065131     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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