Interface trap level in top-contact pentacene thin-film transistors evaluated by displacement current measurement

Organic Electronics

Volumn 11, Issue 4, 2010, Pages 594-598

  Suzuki, Seiichi ^a   Yasutake, Yuhsuke ^a   Majima, Yutaka ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Carrier injection; Displacement current measurements; Interface trap; Organic thin film transistors; Pentacene

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRODES; FIELD EFFECT TRANSISTORS; INTERFACES (MATERIALS); OHMIC CONTACTS; SEMICONDUCTING ORGANIC COMPOUNDS; TEMPERATURE DISTRIBUTION; THIN FILM CIRCUITS; THIN FILMS; THRESHOLD VOLTAGE;

CARRIER INJECTION; DISPLACEMENT CURRENT MEASUREMENTS; INTERFACE TRAPS; ORGANIC THIN FILM TRANSISTORS; PENTACENES;

THIN FILM TRANSISTORS;

EID: 77549084392     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2009.12.020     Document Type: Article

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