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Volumn 83, Issue 17, 2003, Pages 3504-3506

Single-crystal organic field effect transistors with the hole mobility ∼8 cm2/Vs

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CAPACITANCE; ELECTRIC INSULATORS; ELECTRIC POTENTIAL; HOLE MOBILITY; HYDROGENATION; SINGLE CRYSTALS; THIN FILMS;

EID: 0242666862     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1622799     Document Type: Article
Times cited : (412)

References (26)
  • 1
    • 0004227892 scopus 로고    scopus 로고
    • edited by D. Fichou (Wiley, Weinheim)
    • H. E. Katz, A. Dodabalapur, and Z. Bao, in Oligo- and Polythiophene-Based Field-Effect Transistors, edited by D. Fichou (Wiley, Weinheim, 1998); G. Horowitz, Adv. Mater. (Weinheim, Ger.) 10, 365 (1998); F. Garnier, Chem. Phys. 227, 253 (1998); H. E. Katz and Z. Bao, J. Phys. Chem. B 104, 671 (2000); C. D. Dimitracopoulos and P. R. L. Malenfant, Adv. Mater. (Weinheim, Ger.) 14, 99 (2002).
    • (1998) Oligo- and Polythiophene-based Field-effect Transistors
    • Katz, H.E.1    Dodabalapur, A.2    Bao, Z.3
  • 2
    • 0032021761 scopus 로고    scopus 로고
    • Weinheim, Ger.
    • H. E. Katz, A. Dodabalapur, and Z. Bao, in Oligo- and Polythiophene-Based Field-Effect Transistors, edited by D. Fichou (Wiley, Weinheim, 1998); G. Horowitz, Adv. Mater. (Weinheim, Ger.) 10, 365 (1998); F. Garnier, Chem. Phys. 227, 253 (1998); H. E. Katz and Z. Bao, J. Phys. Chem. B 104, 671 (2000); C. D. Dimitracopoulos and P. R. L. Malenfant, Adv. Mater. (Weinheim, Ger.) 14, 99 (2002).
    • (1998) Adv. Mater. , vol.10 , pp. 365
    • Horowitz, G.1
  • 3
    • 2442698405 scopus 로고    scopus 로고
    • H. E. Katz, A. Dodabalapur, and Z. Bao, in Oligo- and Polythiophene-Based Field-Effect Transistors, edited by D. Fichou (Wiley, Weinheim, 1998); G. Horowitz, Adv. Mater. (Weinheim, Ger.) 10, 365 (1998); F. Garnier, Chem. Phys. 227, 253 (1998); H. E. Katz and Z. Bao, J. Phys. Chem. B 104, 671 (2000); C. D. Dimitracopoulos and P. R. L. Malenfant, Adv. Mater. (Weinheim, Ger.) 14, 99 (2002).
    • (1998) Chem. Phys. , vol.227 , pp. 253
    • Garnier, F.1
  • 4
    • 0000443525 scopus 로고    scopus 로고
    • H. E. Katz, A. Dodabalapur, and Z. Bao, in Oligo- and Polythiophene-Based Field-Effect Transistors, edited by D. Fichou (Wiley, Weinheim, 1998); G. Horowitz, Adv. Mater. (Weinheim, Ger.) 10, 365 (1998); F. Garnier, Chem. Phys. 227, 253 (1998); H. E. Katz and Z. Bao, J. Phys. Chem. B 104, 671 (2000); C. D. Dimitracopoulos and P. R. L. Malenfant, Adv. Mater. (Weinheim, Ger.) 14, 99 (2002).
    • (2000) J. Phys. Chem. B , vol.104 , pp. 671
    • Katz, H.E.1    Bao, Z.2
  • 5
    • 0037116556 scopus 로고    scopus 로고
    • Weinheim, Ger.
    • H. E. Katz, A. Dodabalapur, and Z. Bao, in Oligo- and Polythiophene-Based Field-Effect Transistors, edited by D. Fichou (Wiley, Weinheim, 1998); G. Horowitz, Adv. Mater. (Weinheim, Ger.) 10, 365 (1998); F. Garnier, Chem. Phys. 227, 253 (1998); H. E. Katz and Z. Bao, J. Phys. Chem. B 104, 671 (2000); C. D. Dimitracopoulos and P. R. L. Malenfant, Adv. Mater. (Weinheim, Ger.) 14, 99 (2002).
    • (2002) Adv. Mater. , vol.14 , pp. 99
    • Dimitracopoulos, C.D.1    Malenfant, P.R.L.2
  • 18
    • 0242479383 scopus 로고    scopus 로고
    • note
    • Since the studied devices are p-type FETs, we reserve the term "source" for an electrode that is biased positively and injects holes, while the grounded electrode is called the "drain."
  • 19
    • 0242479384 scopus 로고    scopus 로고
    • note
    • SD→0.
  • 20
    • 0242395947 scopus 로고    scopus 로고
    • note
    • -3 is the bulk concentration of traps, and d is the effective channel thickness (≤10 nm). The corresponding threshold voltage, associated with the bulk traps in the studied devices, is therefore very small (<0.1 V).
  • 23
    • 0034504597 scopus 로고    scopus 로고
    • A. B. Chwang and C. D. Frisbie, J. Phys. Chem. B 104, 12202 (2000); P. V. Necliudov, M. S. Shur, D. J. Gundlach, and T. N. Jackson, Solid-State Electron. 47, 259 (2003); J. Zaumseil, K. W. Baldwin, and J. A. Rogers, J. Appl. Phys. 93, 6117 (2003).
    • (2000) J. Phys. Chem. B , vol.104 , pp. 12202
    • Chwang, A.B.1    Frisbie, C.D.2
  • 25
    • 0038650905 scopus 로고    scopus 로고
    • A. B. Chwang and C. D. Frisbie, J. Phys. Chem. B 104, 12202 (2000); P. V. Necliudov, M. S. Shur, D. J. Gundlach, and T. N. Jackson, Solid-State Electron. 47, 259 (2003); J. Zaumseil, K. W. Baldwin, and J. A. Rogers, J. Appl. Phys. 93, 6117 (2003).
    • (2003) J. Appl. Phys. , vol.93 , pp. 6117
    • Zaumseil, J.1    Baldwin, K.W.2    Rogers, J.A.3
  • 26
    • 0242647731 scopus 로고    scopus 로고
    • note
    • SD.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.