Bias stress induced threshold voltage shift in pentacene thin-film transistors

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 45, Issue 42-45, 2006, Pages

  Kawakami, Daisuke ^a   Yasutake, Yuhsuke ^a   Nishizawa, Hideyuki ^a   Majima, Yutaka ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Bias stress voltage; Field effect mobility; Organic thin film transistor; Pentacene; Threshold voltage

Indexed keywords

BIAS VOLTAGE; ELECTRON MOBILITY; FIELD EFFECT TRANSISTORS; STRESS ANALYSIS; THERMAL EFFECTS; THRESHOLD VOLTAGE;

BIAS STRESS VOLTAGE; FIELD-EFFECT MOBILITY; ORGANIC THIN-FILM TRANSISTORS; PENTACENE;

THIN FILM TRANSISTORS;

EID: 34548513336     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.L1127     Document Type: Article

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