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Volumn 256, Issue 10, 2010, Pages 3051-3057
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The interface structure and band alignment at alumina/Cu(Al) alloy interfaces-Influence of the crystallinity of alumina films
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Author keywords
Band alignment; Cu Al alloy; Epitaxial alumina film; In situ oxidation; Interface termination; Photoelectron spectroscopy
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Indexed keywords
ALIGNMENT;
ALUMINUM ALLOYS;
ALUMINUM OXIDE;
AMORPHOUS FILMS;
BINARY ALLOYS;
BINDING ENERGY;
COPPER ALLOYS;
EPITAXIAL GROWTH;
INDIUM ALLOYS;
INTERFACES (MATERIALS);
OXIDATION;
PHOTOELECTRON SPECTROSCOPY;
PHOTOELECTRONS;
PHOTONS;
VALENCE BANDS;
BAND ALIGNMENTS;
CU-AL ALLOYS;
ENERGY-BAND ALIGNMENT;
EPITAXIAL ALUMINA FILMS;
IN-SITU OXIDATION;
OXIDATION TEMPERATURE;
PHOTOELECTRON SPECTRUM;
VALENCE-BAND MAXIMUMS;
ALUMINA;
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EID: 77349116358
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2009.11.072 Document Type: Article |
Times cited : (17)
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References (33)
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