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Volumn 256, Issue 10, 2010, Pages 3051-3057

The interface structure and band alignment at alumina/Cu(Al) alloy interfaces-Influence of the crystallinity of alumina films

Author keywords

Band alignment; Cu Al alloy; Epitaxial alumina film; In situ oxidation; Interface termination; Photoelectron spectroscopy

Indexed keywords

ALIGNMENT; ALUMINUM ALLOYS; ALUMINUM OXIDE; AMORPHOUS FILMS; BINARY ALLOYS; BINDING ENERGY; COPPER ALLOYS; EPITAXIAL GROWTH; INDIUM ALLOYS; INTERFACES (MATERIALS); OXIDATION; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; VALENCE BANDS;

EID: 77349116358     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.11.072     Document Type: Article
Times cited : (17)

References (33)
  • 12
    • 77349114486 scopus 로고    scopus 로고
    • X-ray DATA Booklet, Lawrence Berkeley National Laboratory, University of California, Berkerly, 2001, chapter 1.5.
    • X-ray DATA Booklet, Lawrence Berkeley National Laboratory, University of California, Berkerly, 2001, chapter 1.5.
  • 14
    • 77349087137 scopus 로고    scopus 로고
    • http://www.phy.cuhk.edu.hk/∼surface/XPSPEAK/index.html
  • 26
    • 77349127606 scopus 로고    scopus 로고
    • note
    • Al 2 p respectively, which were provided by private communication from Sigeo Tanuma.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.