HRTEM and EELS characterization of atomic and electronic structures in Cu/α-Al 2 O 3 interfaces

Applied Surface Science

Volumn 241, Issue 1-2 SPEC. ISS., 2005, Pages 87-90

  Sasaki, T ^a   Mizoguchi, T ^a   Matsunaga, K ^a   Tanaka, S ^b   Yamamoto, T ^a   Kohyama, M ^b   Ikuhara, Y ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Atomic structure; Cu Al 2 O 3 interfaces; Electron energy loss spectroscopy (EELS); Electronic structure; High resolution transmission electron microscopy (HRTEM)

Indexed keywords

ALUMINA; COMPUTER SIMULATION; COPPER; CRYSTAL ATOMIC STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; HIGH RESOLUTION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC STRUCTURES; CU/AL2O3 INTERFACES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); SHOULDER PEAKS;

INTERFACES (MATERIALS);

EID: 12244301640     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.022     Document Type: Conference Paper

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