SCOPUS 정보 검색 플랫폼

Volumn 237, Issue 1-4, 2004, Pages 363-368

Surface study and thickness control of thin Al 2 O 3 film on Cu-9%Al(111) single crystal

(3) Yamauchi, Yasuhiro a Yoshitake, Michiko a Song, Weijie a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Auger electron spectroscopy; Cu 9 Al(111) single crystal; Epitaxial Al 2 O 3 thin film; Film thickness control; Oxidation

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; KINETIC ENERGY; OXIDATION; SCANNING ELECTRON MICROSCOPY; SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS; ULTRATHIN FILMS;

BAND BENDING; FILM THICKNESS CONTROL; INSULATOR LAYERS;

ALUMINA;

EID: 4644297647 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2004.06.096 Document Type: Conference Paper

Times cited : (9)

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