HRTEM characterization of atomic structures in Cu/α-Al2O3 (0001) interface

Zairyo/Journal of the Society of Materials Science, Japan

Volumn 52, Issue 6, 2003, Pages 555-559

  Sasaki, Takeo ^a   Matsunaga, Katsuyuki ^a   Ohta, Hiromichi ^b   Hosono, Hideo ^c   Yamamoto, Takahisa ^a   Ikuhara, Yuichi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic structure; Coincidence of reciprocal lattice points method (CRLP); Cu Al2O3 (0001) interface; High resolution transmission electron microscopy (HRTEM); Orientation relationship

Indexed keywords

ALUMINA; CHEMICAL BONDS; COMPUTER SIMULATION; COPPER; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; HIGH RESOLUTION ELECTRON MICROSCOPY; PULSED LASER DEPOSITION; SURFACES; TEMPERATURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

COINCIDENCE OF RECIPROCAL LATTICE POINTS METHOD; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ORIENTATION RELATIONSHIP;

INTERFACES (MATERIALS);

EID: 0042880900     PISSN: 05145163     EISSN: None     Source Type: Journal    
DOI: 10.2472/jsms.52.555     Document Type: Article

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