Growth of ultra-thin amorphous Al2O3 films on CoAl(1 0 0)

Surface Science

Volumn 541, Issue 1-3, 2003, Pages 128-136

  Rose, V ^a   Podgursky, V ^a   Costina, I ^a   Franchy, R ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Aluminum; Aluminum oxide; Amorphous thin films; Auger electron spectroscopy; Cobalt; Electron energy loss spectroscopy (EELS); Low energy electron diffraction (LEED); Oxidation; Scanning tunneling microscopy

Indexed keywords

AMORPHOUS FILMS; AUGER ELECTRON SPECTROSCOPY; CHEMISORPTION; COBALT COMPOUNDS; ELECTRON ENERGY LOSS SPECTROSCOPY; OXIDATION; SCANNING TUNNELING MICROSCOPY;

SURFACE PASSIVATION;

SURFACE REACTIONS;

EID: 0042021769     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00891-4     Document Type: Article

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