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Volumn 96, Issue 7, 2010, Pages

Misfit strain relaxation in m -plane epitaxy of InGaN on ZnO

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC LATTICE MISMATCH; INGAN EPILAYERS; LATTICE MISFIT STRAIN; M-PLANE; MISFIT DISLOCATIONS; MISFIT STRAIN RELAXATION; NEW APPROACHES; PERIODIC ARRAYS; ZNO;

EID: 77249149447     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3315944     Document Type: Article
Times cited : (9)

References (16)
  • 9
    • 79955984192 scopus 로고    scopus 로고
    • Structural characterization of nonpolar (1120) a-plane GaN thin films grown on (1102) r-plane sapphire
    • DOI 10.1063/1.1493220
    • M. D. Craven, S. H. Lim, F. Wu, J. S. Speck, and S. P. DenBaars, Appl. Phys. Lett. 0003-6951 81, 469 (2002). 10.1063/1.1493220 (Pubitemid 34935428)
    • (2002) Applied Physics Letters , vol.81 , Issue.3 , pp. 469
    • Craven, M.D.1    Lim, S.H.2    Wu, F.3    Speck, J.S.4    Denbaars, S.P.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.