Characterization of dislocations in GaN by transmission electron diffraction and microscopy techniques

Applied Physics Letters

Volumn 69, Issue 6, 1996, Pages 770-772

  Ponce, F A ^a   Cherns, D ^b   Young, W T ^b   Steeds, J W ^b  

^a PALO ALTO RESEARCH CENTER   (United States)

^b UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000991291     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117886     Document Type: Article

References (15)

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