Strain mapping in a deformation-twinned nanocrystalline Pd grain

Acta Materialia

Volumn 58, Issue 7, 2010, Pages 2610-2620

  Rosner H ^a   Boucharat, N ^a,b   Padmanabhan, K A ^a,c   Markmann, J ^b,d   Wilde, G ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c ANNA UNIVERSITY   (India)

^d SAARLAND UNIVERSITY   (Germany)

Author keywords

High resolution electron microscopy; Nanocrystalline plasticity; Strain mapping; Twinning

Indexed keywords

DEFORMATION MODES; DEFORMATION TWIN; GEOMETRIC PHASE ANALYSIS; GRAIN INTERIORS; GRAIN SIZE; HIGH STRAIN RATES; IN-PLANE COMPONENTS; MATRIX; NANOCRYSTALLINE PLASTICITY; NANOCRYSTALLINES; ROTATION GRADIENT; SHOCKLEY PARTIALS; STRAIN CONCENTRATION; STRAIN DISTRIBUTIONS; STRAIN MAPPING; STRAIN TENSOR; TEMPORAL EVOLUTION; TWIN BOUNDARIES; WHOLE GRAINS;

DEFORMATION; ELECTRON MICROSCOPY; GRAIN SIZE AND SHAPE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAPPING; PALLADIUM; PLASTICITY;

STRAIN RATE;

EID: 77249102522     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.12.047     Document Type: Article

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