Calibration of projector lens distortions

Journal of Electron Microscopy

Volumn 54, Issue 3, 2005, Pages 181-190

  Hue F ^a   Johnson, C L ^b,c   Lartigue Korinek, S ^a   Wang, G ^a   Buseck, P R ^b   Hytch M J ^a,d  

^a CNRS   (France)

^b ARIZONA STATE UNIVERSITY   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d CEMES CNRS   (France)

Author keywords

Geometric phase; HRTEM; Lattice parameter determination; Optical distortions; Projector lens; Strain

Indexed keywords

CHAENACTIS;

CALIBRATION; LENSES; OPTICAL LATTICES;

ELECTRON MICROSCOPE IMAGES; GEOMETRIC PHASE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; LATTICE PARAMETER DETERMINATION; LENS SYSTEMS; OPTICAL DISTORTION; PARAMETER DETERMINATION; PROJECTOR LENS; PROJECTOR LENS DISTORTION; STRAINS DETERMINATION;

LATTICE CONSTANTS;

EID: 27744564695     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfi042     Document Type: Article

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