Stress and strain around grain-boundary dislocations measured by high-resolution electron microscopy

Philosophical Magazine

Volumn 86, Issue 29-31, 2006, Pages 4641-4656

  Hytch M J ^a   Putaux, J L ^b   Thibault, J ^c  

^a CEMES CNRS   (France)

^b CENTRE DE RECHERCHES SUR LES MACROMOLÉCULES VÉGÉTALES CERMAV CNRS   (France)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; INTERFACES (MATERIALS); STRAIN; STRESS ANALYSIS;

ELASTIC CONSTANTS; MATRIX DISLOCATION; PHASE ANALYSIS;

DISLOCATIONS (CRYSTALS);

EID: 33746783341     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430600743876     Document Type: Article

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