Validating grain size analysis from X-ray line broadening: A virtual experiment

Scripta Materialia

Volumn 59, Issue 1, 2008, Pages 15-18

  Markmann, J ^a,b   Yamakov, V ^c   Weissmuller J ^a,b  

^a SAARLAND UNIVERSITY   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c NATIONAL INSTITUTE OF AEROSPACE   (United States)

Author keywords

Molecular dynamics; Nanocrystalline materials; X ray diffraction

Indexed keywords

COMPUTER SIMULATION; MICROANALYSIS; MOLECULAR DYNAMICS; NANOCRYSTALLINE MATERIALS; X RAY DIFFRACTION;

GRAIN INTERIORS; GRAIN SIZE ANALYSIS; MICROSTRAIN; MOLECULAR DYNAMICS SIMULATION;

GRAIN SIZE AND SHAPE;

EID: 43049150058     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.02.056     Document Type: Article

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