Grain- and phase-boundary stress effects in nanocrystalline materials

Acta Materialia

Volumn 57, Issue 6, 2009, Pages 1703-1716

  Birringer, R ^a   Zimmer, P ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

Ag Ni; Interface; Nanocrystalline; Stress; X ray diffraction

Indexed keywords

DIFFRACTION; EXTRACTION; GADOLINIUM; MELTING POINT; NANOCRYSTALLINE MATERIALS; PALLADIUM; PARAMETER ESTIMATION; SILVER; X RAY DIFFRACTION;

ABSOLUTE VALUES; AG/NI; AG/NI INTERFACES; GRAIN-BOUNDARY; INTERFACE; INTERFACE STRESS; ISOTROPIC PHASE; LATTICE PARAMETERS; MELTING TEMPERATURES; NANOCRYSTALLINE; PHASE-BOUNDARY; PRECISE MEASUREMENTS; PRINCIPAL OF VIRTUAL WORKS; RANDOM HETEROGENEOUS MATERIALS; STRAIN-FREE;

PHASE INTERFACES;

EID: 61349163668     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.11.040     Document Type: Article

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