Optimizing your position on the operating curve: How can a fab truly maximize its performance?

IEEE Transactions on Semiconductor Manufacturing

Volumn 23, Issue 1, 2010, Pages 21-29

  Weber, Charles M ^a   Fayed, Asser ^b  

^a PORTLAND STATE UNIVERSITY   (United States)

^b CYPRESS SEMICONDUCTOR   (United States)

Author keywords

Operating curve; Optimizing; Value driven

Indexed keywords

FAB PERFORMANCE; OPERATING CURVE; OPERATING POINTS; REALISTIC CONDITIONS; VALUE DRIVEN;

OPTIMIZATION; PROFITABILITY;

CURVE FITTING;

EID: 76849101617     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2009.2039248     Document Type: Article

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