Accurate determination of spring constant of atomic force microscope cantilevers and comparison with other methods

Measurement: Journal of the International Measurement Confederation

Volumn 43, Issue 4, 2010, Pages 520-526

  Kim, Min Seok ^a   Choi, Jae Hyuk ^a   Kim, Jong Ho ^a   Park, Yon Kyu ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

Author keywords

Atomic force microscopy; Calibration; Force metrology; Spring constant

Indexed keywords

AFM CANTILEVERS; ATOMIC FORCE MICROSCOPE CANTILEVERS; CALIBRATION METHOD; CANTILEVER METHOD; FORCE METROLOGY; SPRING CONSTANTS; TAPPING MODES;

ATOMS; CALIBRATION; NANOCANTILEVERS; UNCERTAINTY ANALYSIS;

ATOMIC FORCE MICROSCOPY;

EID: 76849094806     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2009.12.020     Document Type: Article

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