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Volumn 84, Issue 7, 2010, Pages 896-901
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Study of the effect of plasma current density on the formation of titanium nitride and titanium oxynitride thin films prepared by reactive DC magnetron sputtering
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Author keywords
Plasma current density; Thin film; Titanium oxynitride
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Indexed keywords
COLOR;
COLORIMETRIC ANALYSIS;
COLORIMETRY;
CRYSTAL ORIENTATION;
CURRENT DENSITY;
FLOW OF GASES;
HARDNESS;
MAGNETRON SPUTTERING;
OXYGEN;
TITANIUM NITRIDE;
X RAY DIFFRACTION;
DC MAGNETRON SPUTTERING;
GRAZING INCIDENCE X-RAY DIFFRACTION;
OXYGEN INCORPORATION;
PLASMA CURRENTS;
REACTIVE DC MAGNETRON SPUTTERING;
THICKNESS OF THE FILM;
TITANIUM NITRIDE FILMS;
TITANIUM OXYNITRIDE;
THIN FILMS;
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EID: 76849086385
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2009.12.004 Document Type: Article |
Times cited : (39)
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References (28)
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