In situ measurements on individual thin carbon nanotubes using nanomanipulators inside a scanning electron microscope

Ultramicroscopy

Volumn 110, Issue 3, 2010, Pages 182-189

  Wei, XianLong ^a   Chen, Qing ^a   Peng, LianMao ^a   Cui, Rongli ^b   Li, Yan ^b  

^a PEKING UNIVERSITY   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

Carbon nanotubes; in situ measurement; Scanning electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; ATOMIC STRUCTURE; AXIAL STRAIN; BAND GAPS; BREAKING STRENGTH; DOUBLE-WALLED CNT; ELECTRICAL TRANSPORT PROPERTIES; ELECTROMECHANICAL MEASUREMENTS; ELECTROMECHANICAL PROPERTY; IN-SITU; IN-SITU MEASUREMENT; NANOMANIPULATORS; NOVEL METHODS; PICKING UP; SCANNING ELECTRON MICROSCOPE; SEMICONDUCTING TRANSITION; SINGLE-WALLED; STRUCTURE CHARACTERIZATION; TRANSMISSION ELECTRON MICROSCOPE; YOUNG'S MODULUS;

CARBON FILMS; ELECTRIC PROPERTIES; ELECTRON MICROSCOPES; ELECTRONS; MECHANICAL PROPERTIES; MICROMANIPULATORS; SCANNING; SCANNING ELECTRON MICROSCOPY; STEREOCHEMISTRY; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

CARBON NANOTUBES;

CARBON NANOTUBE; DOUBLE WALLED NANOTUBE; SILICON DIOXIDE; SINGLE WALLED NANOTUBE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHIRALITY; CONTROLLED STUDY; ELECTRICAL PARAMETERS; MOLECULAR MECHANICS; NANODEVICE; NANOMANIPULATOR; PHASE TRANSITION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY; YOUNG MODULUS;

EID: 75849154506     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.007     Document Type: Article

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