Performing probe experiments in the SEM

Micron

Volumn 35, Issue 6, 2004, Pages 495-502

  Peng, L M ^a   Chen, Q ^a   Liang, X L ^a   Gao, S ^a   Wang, J Y ^a   Kleindiek, S ^b   Tai, S W ^c  

^a PEKING UNIVERSITY   (China)

^b Kleindiek Nanotechnik GmbH   (Germany)

^c Vantage Hightech Investm C   (China)

Author keywords

Nanomanipulation; Nanoprobes; Nanotechnology; Scanning electron microscope

Indexed keywords

EID: 2342450768     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2003.12.005     Document Type: Conference Paper

References (5)

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2. x nanotubes. Appl. Phys. Lett. 82:2003;3319-3321
3. Feynman R.P. There's plenty of room at the bottom. 1960;. available on the Web: http://www.zyvex.com/nanotech/feynman.html
4. Morgan C., Chen G.S., Boothroyd C., Bailey S., Humphrey C. Ultimate limits of lithography. Phys. World. November:1992;28-32
5. Wiesendanger R. Scanning Probe Microscopy and Spectroscopy. 1994;Cambridge University Press, Cambridge