Study of the current stressing in nanomanipulated three-dimensional carbon nanotube structures

Applied Physics Letters

Volumn 87, Issue 3, 2005, Pages

  Cox, D C ^a   Forrest, R D ^a   Smith, P R ^a   Stolojan, V ^a   Silva, S R P ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BESPOKE CARBON NANOTUBES; CURRENT STRESSING; DEVICE STRUCTURE; MECHANICAL INTEGRITY;

CURRENT DENSITY; ELECTRIC CONDUCTIVITY; METALLIZING; MICROSTRUCTURE; NANOTECHNOLOGY; WELDING;

CARBON NANOTUBES;

EID: 24144467488     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1990268     Document Type: Article

References (17)

1. Carbon Nanotubes: Synthesis, Structure, Properties and Application, edited by, M. S. Dresselhaus, G. Dresselhaus, and, P. Avouris, (Springer, New York, 2000).
2. S. J. Tans, M. H. Devoret, H. J. Dai, A. Thess, R. E. Smalley, L. J. Geerligs, and C. Dekker, Nature (London) 386, 474 (1997).
3. C. T. White and T. N. Todorov, Nature (London) 393, 240 (1998).
4. J. Li, Q. Ye, A. Cassell, H. T. Ng, R. Stevens, J. Han, and M. Meyyappan, Appl. Phys. Lett. 82, 2491 (2003).
5. R. Martel, Nat. Mater. 1, 203 (2003).
6. R. H. Baughman, A. A. Zakhidov, and W. A. de Heer, Science 297, 787 (2002).
7. P. L. Mc Euen, M. S. Fuhrer, and P. Hongkun, IEEE Trans. Nanotechnol. 1, 78 (2002).
8. J. Appenzeller, J. Knoch, R. Martel, V. Derycke, S. J. Wind, and Ph. Avouris, IEEE Trans. Nanotechnol. 1, 184 (2002).
9. W. Henk, Ch. Postma, M. de Jonge, Z. Yao, and C. Dekker, Phys. Rev. B 62, 10653 (2000).
10. F. Banhart, Nano Lett. 1, 329 (2001).
11. Madsen D. Nørgard, K. Mølhave, R. Mateiu, A. M. Rasmussen, M. Brorson, C. J. H. Jacobsen, and P. Bøggild, Nano Lett. 3, 47 (2003).
12. S. D. Berger, D. R. McKenzie, and P. J. Martin, Philos. Mag. Lett. 57, 285 (1988).
13. W. Y. Jang, N. N. Kulkarni, C. K. Shih, and Z. Yao, Appl. Phys. Lett. 84, 1177 (2004).
14. Y. X. Liang, Q. H. Li, and T. H. Wang, Appl. Phys. Lett. 84, 3379 (2004).
15. P. G. Collins, M. Hersam, M. Arnold, R. Martel, and Ph. Avouris, Phys. Rev. Lett. 86, 3128 (2002).
16. Ph. Poncharal, C. Berger, Y. Yi, Z. L. Wang, and W. A. de Heer, J. Phys. Chem. B 106, 12104 (2002).
17. P. J. de Pablo, S. Howell, S. Crittenden, B. Walsh, E. Graugnard, and R. Reifenberger, Appl. Phys. Lett. 75, 3941 (1999).