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Volumn 156-158, Issue , 2009, Pages 11-18
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Dislocation engineering in multicrystalline silicon
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Author keywords
Annihilation; Dislocations; High temperature anneal; Mc si; Ribbon silicon
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Indexed keywords
ANNEALING;
DEFECTS;
POLYSILICON;
SEMICONDUCTOR DEVICE MANUFACTURE;
SILICON NITRIDE;
DISLOCATIONS (CRYSTALS);
AMBIENT CONDITIONS;
ANNEALING TEMPERATURES;
ANNIHILATION;
CRYSTALLOGRAPHIC GLIDE;
DISLOCATION ANNIHILATION;
DISLOCATION DENSITY REDUCTION;
DISLOCATION ENGINEERING;
DISLOCATION MOVEMENT;
FACE-CENTERED CUBIC METALS;
HIGH TEMPERATURE;
HIGH TEMPERATURE TREATMENTS;
HIGH-TEMPERATURE ANNEALING;
MULTI-CRYSTALLINE SILICON;
MULTICRYSTALLINE SILICON (MC-SI);
SILICON NITRIDE COATING;
TEMPERATURE DEPENDENT;
TIME-DEPENDENT MODELS;
HIGH-TEMPERATURE ANNEAL;
RIBBON SILICONS;
SINGLE CRYSTALS;
DEFECTS;
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EID: 75849142249
PISSN: 10120394
EISSN: None
Source Type: Book Series
DOI: 10.4028/www.scientific.net/SSP.156-158.11 Document Type: Conference Paper |
Times cited : (18)
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References (23)
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