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Volumn 156-158, Issue , 2009, Pages 11-18

Dislocation engineering in multicrystalline silicon

Author keywords

Annihilation; Dislocations; High temperature anneal; Mc si; Ribbon silicon

Indexed keywords

ANNEALING; DEFECTS; POLYSILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON NITRIDE; DISLOCATIONS (CRYSTALS);

EID: 75849142249     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.156-158.11     Document Type: Conference Paper
Times cited : (18)

References (23)
  • 16
    • 84902933240 scopus 로고    scopus 로고
    • W.S. Rasband. U. S. National Institutes of Health. http://rsb.info.nih. gov/ij/
    • W.S. Rasband. U. S. National Institutes of Health. http://rsb.info.nih. gov/ij/
  • 20
    • 0000950516 scopus 로고    scopus 로고
    • Y.M. Huang, J.C.H. Spence, O.F. Sankey 74 (1995) pp. 3392
    • Y.M. Huang, J.C.H. Spence, O.F. Sankey Vol. 74 (1995) pp. 3392


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.