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Volumn 14, Issue 8, 2006, Pages 711-719

High-efficiency solar cells on phosphorus gettered multicrystalline silicon substrates

Author keywords

Crystalline silicon solar cells; Gettering; High efficiency; Multicrystalline silicon; Silicon oxide

Indexed keywords

DIFFUSION; DISLOCATIONS (CRYSTALS); DOPING (ADDITIVES); PHOSPHORUS; POLYSILICON; SEMICONDUCTING GALLIUM; SILICON WAFERS;

EID: 33845592024     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.736     Document Type: Article
Times cited : (45)

References (16)
  • 6
    • 2942621025 scopus 로고    scopus 로고
    • Base doping and recombination activity of impurities in crystalline silicon solar cells
    • Geerligs LJ, Macdonald D. Base doping and recombination activity of impurities in crystalline silicon solar cells. Progress in Photovoltaics: Research and Applications 2004; 12(4): 309-316.
    • (2004) Progress in Photovoltaics: Research and Applications , vol.12 , Issue.4 , pp. 309-316
    • Geerligs, L.J.1    Macdonald, D.2
  • 7
    • 0040028982 scopus 로고    scopus 로고
    • Minority carrier lifetime degradation in boron-doped Czochralski silicon
    • Glunz SW, Rein S, Lee JY, Warta W. Minority carrier lifetime degradation in boron-doped Czochralski silicon. Journal of Applied Physics 2001; 90(5): 2397-2404.
    • (2001) Journal of Applied Physics , vol.90 , Issue.5 , pp. 2397-2404
    • Glunz, S.W.1    Rein, S.2    Lee, J.Y.3    Warta, W.4
  • 8
    • 0036533283 scopus 로고    scopus 로고
    • Gettering of impurities in solar silicon
    • Périchaud I. Gettering of impurities in solar silicon. Solar Energy materials and Solar Cells 2002; 72(1-4): 315-326.
    • (2002) Solar Energy Materials and Solar Cells , vol.72 , Issue.1-4 , pp. 315-326
    • Périchaud, I.1
  • 10
    • 0037391034 scopus 로고    scopus 로고
    • Imaging method for laterally resolved measurement of minority carrier densities and lifetimes: Measurement principle and first applications
    • Isenberg J, Riepe S, Glunz SW, Warta W. Imaging method for laterally resolved measurement of minority carrier densities and lifetimes: measurement principle and first applications. Journal of Applied Physics 2003; 93(7): 4268-4275.
    • (2003) Journal of Applied Physics , vol.93 , Issue.7 , pp. 4268-4275
    • Isenberg, J.1    Riepe, S.2    Glunz, S.W.3    Warta, W.4
  • 12
    • 84951050944 scopus 로고
    • Dislocation etch for (100) planes in silicon
    • Secco d'Aragona F. Dislocation etch for (100) planes in silicon. Solid-State Science and Technology 1972; 119(7): 948-951.
    • (1972) Solid-state Science and Technology , vol.119 , Issue.7 , pp. 948-951
    • Secco D'Aragona, F.1
  • 13
    • 1642438225 scopus 로고    scopus 로고
    • Carrier density imaging as a tool for characterising the electrical activity of defects in pre-processed multicrystalline silicon
    • Riepe S, Stokkan G, Kieliba T, Warta W. Carrier Density Imaging as a tool for characterising the electrical activity of defects in pre-processed multicrystalline silicon. Solid State Phenomena 2004; 95-96: 229-234.
    • (2004) Solid State Phenomena , vol.95-96 , pp. 229-234
    • Riepe, S.1    Stokkan, G.2    Kieliba, T.3    Warta, W.4
  • 14
    • 0011162670 scopus 로고
    • High efficiency polycrystalline silicon solar cells using phosphorus pretreatment
    • Narayanan S, Wenham SR, Green MA. High efficiency polycrystalline silicon solar cells using phosphorus pretreatment. Applied Physics Letters 1986; 48(13): 873-875.
    • (1986) Applied Physics Letters , vol.48 , Issue.13 , pp. 873-875
    • Narayanan, S.1    Wenham, S.R.2    Ma, G.3
  • 16
    • 1642560912 scopus 로고    scopus 로고
    • Estimation of the upper limit of the minority-carrier diffusion length in multicrystalline silicon: Limitation of the action of gettering and passivation on dislocations
    • Kittler M, Seifert W. Estimation of the upper limit of the minority-carrier diffusion length in multicrystalline silicon: limitation of the action of gettering and passivation on dislocations. Solid State Phenomena 2004; 95-96: 197-204.
    • (2004) Solid State Phenomena , vol.95-96 , pp. 197-204
    • Kittler, M.1    Seifert, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.