Unanticipated C=C bonds in covalent monolayers on silicon revealed by NEXAFS

Langmuir

Volumn 26, Issue 3, 2010, Pages 1512-1515

  Lee, Michael V ^a   Lee, Jonathan R I ^b   Brehmer, Daniel E ^c   Linford, Matthew R ^d   Willey, Trevor M ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d Brigham Young University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1-ALKENES; C-C BONDS; DOUBLE BONDS; ELECTRICAL TRANSPORT; INTERFACE CONTROL; MATERIAL PROPERTY; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; ORGANIC MONOLAYERS; RADICAL-BASED MECHANISMS; RE-EVALUATION; SATURATED MONOLAYERS;

ABSORPTION SPECTROSCOPY; BIOLOGY; ELECTRIC PROPERTIES; OLEFINS; OPTICAL PROPERTIES; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

MONOLAYERS;

CARBON; SILICON;

ARTICLE; CHEMISTRY; MECHANICS; TEMPERATURE; X RAY ABSORPTION SPECTROSCOPY;

CARBON; MECHANICAL PROCESSES; SILICON; TEMPERATURE; X-RAY ABSORPTION SPECTROSCOPY;

EID: 75749126203     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9038254     Document Type: Article

References (32)

1. Linford, M. R.; Chidsey, C. E. D. J. Am. Chem. Soc. 1993, 115, 12631-12632.
2. Wojtyk, J. T. C.; Morin, K. A.; Boukherroub, R.; Wayner, D. D. M. Langmuir 2002, 18, 6081-6087.
3. de Smet, L. C. P. M.; Stork, G. A.; Hurenkamp, G. H. F.; Sun, Q.; Topai, H.; Vronen, P. J. E.; Sieval, A. B.; Wright, A.; Visser, G. M.; Zuilhof, H.; Sudholter, E. J. R. J. Am. Chem. Soc. 2003, 125, 13916-13917.
4. Booking, T.; James, M.; Coster, H. G. L.; Chilcott, T. C.; Barrow, K. D. Langmuir 2004, 20, 9227-9235.
5. Ashurst, W. R.; Yau, C.; Carraro, C.; Lee, C.; Kluth, G. J.; Howe, R. T.; Maboudian, R. Sens. Actuators, A 2001, 91, 239-248.
6. Bateman, J. E.; Eagling, R. D.; Worrall, D. R.; Horrocks, B. R.; Houlton, A. Angew. Chem., Int. Ed. 1998, 37, 2683-2685.
7. Boukherroub, R.; Morin, S.; Wayner, D.; Lockwood, D. Phys. Status Solidi A 2000, 182, 117-121.
8. Boukherroub, R.; Morin, S.; Wayner, D.; Bensebaa, F.; Sproule, G.; Baribeau, J.; Lockwood, D. Chem. Mater. 2001, 13, 2002-2011.
9. Buriak, J. M.; Stewart, M. P.; Geders, T. W.; Allen, M. J.; Choi, H. C.; Smith, J.; Raftery, D.; Canham, L. T. J. Am. Chem. Soc. 1999, 121, 11491-11502.
10. Lee, M. V.; Hoffman, M. T.; Barnett, K.; Geiss, J.; Smentkowski, V. S.; Linford, M. R.; Davis, R. C. J. Nanosci. Nanotechnol. 2006, 6, 1639-1643.
11. Yang, L.; Lua, Y.; Tan, M.; Scherman, O. A.; Grubbs, R. H.; Harb, J. N.; Davis, R. C.; Linford, M. R. Chem. Mater. 2007, 19, 1671-1678.
12. Lee, M. V.; Nelson, K. A.; Hutchins, L.; Becerril, H. A.; Cosby, S. T.; Blood, J. C.; Wheeler, D. R.; Davis, R. C.; Wooliey, A. T.; Harb, J. N.; Linford, M. R. Chem. Mater. 2007, 19, 5052-5054.
13. Linford, M. R.; Fenter, P.; Eisenberger, P. M.; Chidsey, C. E. D. J. Am. Chem. Soc. 1995, 117, 3145-3155.
14. Lopinski, G. P.; Wayner, D. D. M.; Wolkow, R. A. Nature 2000, 406, 48-51.
15. Eves, B. J.; Sun, Q.; Lopinski, G. P.; Zuilhof, H. J. Am. Chem. Soc. 2004, 126, 14318-14319.
16. Linford, M. R. Producing Coated Particles by Grinding in the Presence of Reactive Species. U.S. Patent 6,132,801, Oct 17, 2000.
17. Niederhauser, T. L.; Lua, Y., Jiang, G.; Davis, S. D.; Matheson, R.; Hess, D. A.; Mowat, I. A.; Linford, M. R. Angew. Chem., Im. Ed. 2002, 41, 2353-2356.
18. Yang, L.; Lua, Y.; Lee, M. V.; Linford, M. R. Acc. Chem. Res. 2005, 38, 933-942.
19. Niederhauser, T. L.; Jiang, G.; Lua, Y.; Dorff, M. J.; Woolley, A. T.; Asplund, M. C.; Berges, D. A.; Linford, M. R. Langmuir 2001, 17, 5889-5900.
20. Buriak, J. Chem. Rev. 2002, 102, 1271-1308.
21. Seitz, O.; Vilan, A.; Cohen, H.; Hwang, J,; Haeming, M.; Schoell, A.; Umbach, E.; Kahn, A.; Cahen, D. Adv. Funct. Maler. 2008, 18, 2102-2113.
22. Hu, Y. F.; Boukherroub, R.; Sham, T. K. J. Electron Spectrosc. Relat. Phenom. 2004, 135, 143-147.
23. Lee, M. V.; Richards, J. L.; Linford, M. R.; Casey, S. M. J. Vac. Sci. Technol., B 2006, 24, 750-755.
24. Willey, T. M. Characterization of Functionalized Self-Assembled Monolayers and Surface-Attached. Interlocking Molecules Using Near-Edge X-ray Absorption Fine Structure Spectroscopy. Ph.D. Dissertation, University of California, Davis, CA, 2004.
25. Sieval, A.; Demirel, A.; Nissink, J.; Linford, M.; van der Maas, J.; de Jeu, W.; Zuilhof, H.; Sudholter, E. Langmuir 1998, 14, 1759-1768.
26. Lin-Vien, D.; Colthup, N. B.; Fateley, W. G.; Grasselli, J. G. The Handbook of Infrared and Raman Characteristic Frequencies of Organic Molecules; Academic Press: San Diego, CA; 1991; pp 74, 84-85.
27. Scheres, L.; Arafat, A.; Zuilhof, H. Langmuir 2007, 23, 8343-8346.
28. Matsui, F.; Yeom, H. W.; Matsuda, I.; Ohta, T. Phys. Rev. B 2000, 62, 5036.
29. From adsorbed ethylene NEXAFS in ref 27, if there were six more saturated carbons per molecule then the step edge would be 4 times as tall and the height of the 285 eV peak is about 0.8 times this value. The ratios of the ∼285 eV peak maximum to the step edge height in the monolayers in Figure 2 are 0.34, 0.28, and 0.13.
30. Calculated values were 0.40, 0.38, and 0.2.1.
31. Jiang, G.; Niederhauser, T. L.; Fleming, S. A.; Asplund, M. C.; Linford, M. R. Langmuir 2004, 20, 1772-1774.
32. Lide, D. R., Ed. CRC Handbook of Chemistry and Physics, 85th ed.; CRC: New York; 2004.