Sputtering of organic molecules by clusters, with focus on fullerenes

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 1229-1234

  Delcorte, A ^a   Wehbe, N ^a   Bertrand, P ^a   Garrison, B J ^b  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Depth profiling; Fullerenes; Gold; Ion formation; Molecular dynamics; Molecular emission; Polymers; ToF SIMS

Indexed keywords

DEPTH PROFILING; DESORPTION; FULLERENES; GOLD; IONIZATION; MOLECULAR DYNAMICS; POLYMERS; PROJECTILES; REACTION KINETICS; SECONDARY ION MASS SPECTROMETRY;

CLUSTER PROJECTILES; CLUSTER-INDUCED SPUTTERING; ENERGY DISTRIBUTION MEASUREMENT; EXPERIMENTAL INVESTIGATIONS; ION FORMATION; MOLECULAR DYNAMICS SIMULATIONS; MOLECULAR EMISSIONS; TOF SIMS;

ORGANIC POLYMERS;

EID: 56449089777     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.107     Document Type: Article

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