Fundamental studies of molecular depth profiling and 3D imaging using Langmuir-Blodgett films as a model

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 816-818

  Zheng, Leiliang ^a   Wucher, Andreas ^b   Winograd, Nicholas ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

3D imaging; Cluster beam; Langmuir Blodgett films; Molecular depth profiling; Multilayers; SIMS

Indexed keywords

BARIUM; BIOLOGICAL MATERIALS; CHARACTERIZATION; DEPTH PROFILING; IMAGING SYSTEMS; MOLECULAR IMAGING; MULTILAYER FILMS; MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; STRUCTURE (COMPOSITION);

3D IMAGING; CLUSTER BEAMS; CRYOGENIC CONDITIONS; DIFFERENTIAL SPUTTERING; MATERIALS CHARACTERIZATION; MOLECULAR DEPTH PROFILING; QUANTITATIVE MEASUREMENT; THREE DIMENSIONAL IMAGING;

LANGMUIR BLODGETT FILMS;

EID: 56449085398     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.250     Document Type: Article

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