Teleoperated 3-D force feedback from the nanoscale with an atomic force microscope

IEEE Transactions on Nanotechnology

Volumn 9, Issue 1, 2010, Pages 46-54

  Onal, Cagdas Denizel ^a   Sitti, Metin ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Adaptive control; Atomic force microscopy (AFM); Bilateral control; Nanorobotics; Passivity control; Teleoperation

Indexed keywords

ADAPTIVE CONTROL; ADAPTIVE OBSERVER; AFM CANTILEVERS; ATOMIC FORCE MICROSCOPES; BILATERAL CONTROL; FORCE DECOUPLING; FORCE FEEDBACK; FRICTION FORCE; FRICTION MODELS; FRICTION VALUES; HAPTIC DEVICES; HORIZONTAL FORCES; LOCAL SURFACES; NANO SCALE; NANO-SCALE SURFACES; PASSIVITY CONTROL; SOFT SURFACE; TELE-OPERATIONS; TELEOPERATED; VERTICAL FORCE;

ADAPTIVE CONTROL SYSTEMS; ATOMIC FORCE MICROSCOPY; ATOMS; FRICTION; MATHEMATICAL OPERATORS; NANOROBOTICS; NANOSTRUCTURED MATERIALS; PASSIVATION; REMOTE CONTROL; TRIBOLOGY;

THREE DIMENSIONAL;

EID: 75449084743     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2009.2021472     Document Type: Article

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