Cross-talk compensation in atomic force microscopy

Review of Scientific Instruments

Volumn 79, Issue 10, 2008, Pages

  Onal, Cagdas D ^a   Sümer, Bilsay ^a   Sitti, Metin ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMS; CROSSTALK; ESTERS; EXPERIMENTS; FORCE MEASUREMENT; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY;

AFFINE TRANSFORMATIONS; AFM SYSTEMS; ATOMIC FORCES; CASE STUDIES; DETRIMENTAL EFFECTS; FLAT SURFACES; LATERAL DEFLECTIONS; MEASURED SIGNALS; MEASUREMENT EXPERIMENTS; MECHANICAL CHARACTERIZATIONS; POLIES (METHYL METHACRYLATE); RAW SIGNALS; SIMPLE CIRCUITS; TRANSFORMATION MATRIXES; VOLTAGE SIGNALS;

ATOMIC FORCE MICROSCOPY;

EID: 55349146935     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3002483     Document Type: Conference Paper

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