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Volumn 312, Issue 5, 2010, Pages 645-650
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Low-temperature homoepitaxial growth of 4H-SiC with CH3Cl and SiCl4 precursors
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Author keywords
A1. Crystal morphology; A1. Growth models; A3. Chemical vapor deposition; A3. Chloride vapor phase epitaxy; A3. Hot wall epitaxy; B2. Semiconducting silicon carbide
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Indexed keywords
A1. GROWTH MODELS;
A3. HOT WALL EPITAXY;
CHLORIDE VAPOR-PHASE EPITAXY;
CRYSTAL MORPHOLOGIES;
GROWTH MODELS;
HOT-WALL EPITAXY;
AERODYNAMICS;
CHEMICAL VAPOR DEPOSITION;
CHLORINE;
CHLORINE COMPOUNDS;
CRYSTAL GROWTH;
FLOW OF GASES;
MORPHOLOGY;
NUCLEATION;
SEMICONDUCTING SILICON;
SEMICONDUCTOR GROWTH;
SILICON CARBIDE;
VAPOR PHASE EPITAXY;
VAPORS;
WINDOWS;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 74549117943
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2009.12.017 Document Type: Article |
Times cited : (22)
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References (14)
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