From tunneling to hopping: A comprehensive investigation of charge transport mechanism in molecular junctions based on oligo(p-phenylene ethynylene)s

ACS Nano

Volumn 3, Issue 12, 2009, Pages 3861-3868

  Lu, Qi ^a,b   Liu, Ke ^a   Zhang, Hongming ^a   Du, Zhibo ^a   Wang, Xianhong ^a   Wang, Fosong ^a  

^a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Charge transport mechanism; Conducting probe atomic force microscopy; Hopping conduction; Oligo(p phenylene ethynylene)s; Scanning tunneling microscopy; Single molecular resistance; Tunneling conduction

Indexed keywords

CHARGE TRANSPORT MECHANISMS; CONDUCTING PROBE ATOMIC FORCE MICROSCOPIES; HOPPING CONDUCTION; OLIGO(P-PHENYLENE ETHYNYLENE)S; P-PHENYLENE; TUNNELING CONDUCTION;

AROMATIC COMPOUNDS; ATOMIC FORCE MICROSCOPY; ATOMS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRONIC STRUCTURE; FIELD EMISSION; MOLECULAR ELECTRONICS; POLYETHYLENES; PROBES; SCANNING; SCANNING TUNNELING MICROSCOPY;

WIND TUNNELS;

NANOMATERIAL; POLY(PHENYLENE ETHYNYLENE); POLYMER;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER SIMULATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MODELS, CHEMICAL; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; POLYMERS; SURFACE PROPERTIES;

EID: 73849101068     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn9012687     Document Type: Article

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