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Volumn 39, Issue 10, 2009, Pages 1719-1724
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An investigation of phosphate based ECMP electrolyte performance on feature scale planarization
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Author keywords
BTA; Copper; ECMP; Planarization; Potassium phosphate
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Indexed keywords
AG/AGCL;
ALTERNATIVE METHODS;
APPLIED VOLTAGES;
BENZOTRIAZOLES;
CMP PROCESS;
CONCENTRATION OF;
COPPER CHEMICAL MECHANICAL PLANARIZATION;
ECMP;
ELECTROCHEMICAL MECHANICAL PLANARIZATION;
FEATURE SIZES;
INDUSTRIAL STANDARDS;
METAL THICKNESS;
NEW MATERIAL;
PH VALUE;
PLANARIZATION;
PLANARIZATION CAPABILITY;
POLISHING PADS;
POTASSIUM PHOSPHATE;
STEP HEIGHT;
CHEMICAL MECHANICAL POLISHING;
COPPER;
ELECTROLYSIS;
NANOTECHNOLOGY;
PHOSPHATES;
POLISHING;
STRUCTURES (BUILT OBJECTS);
ELECTROLYTES;
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EID: 73149085272
PISSN: 0021891X
EISSN: None
Source Type: Journal
DOI: 10.1007/s10800-009-9865-7 Document Type: Article |
Times cited : (8)
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References (19)
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