Analyses of images of neutron interactions and single particle displacement damage in CCD arrays

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3579-3584

  Chugg, A M ^a   Jones, R ^a   Moutrie, M J ^a   Truscott, P R ^b  

^a Radiation Effects Group   (United Kingdom)

^b QINETIQ   (United Kingdom)

Author keywords

Annealing; APS; CCD; Charge collection efficiency; Dark current spike; GEANT4; Neutron interactions; Particle tracks; Random telegraph signal (RTS); Single particle displacement damage effects (SPDDE); Transient events

Indexed keywords

ANNEALING; ARRAYS; CHARGE COUPLED DEVICES; LIGHT MODULATION; OPTICAL RESOLVING POWER; RADIATION; SILICON;

APS; CHARGE COLLECTION EFFICIENCY; DARK CURRENT SPIKE; GEANT4; NEUTRON INTERACTIONS; PARTICLE TRACKS; RANDOM TELEGRAPH SIGNAL (RTS); SINGLE PARTICLE DISPLACEMENT DAMAGE EFFECTS (SPDDE); TRANSIENT EVENTS;

NEUTRONS;

EID: 11044237128     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839164     Document Type: Conference Paper

References (10)

1. A. M. Chugg, R. Jones, M. J. Moutrie, J. R. Armstrong, D. B. S. King, and N. Moreau, "Single particle dark current spikes induced in CCDs by high energy neutrons," IEEE Trans. Nucl. Sci., vol. 50, pp. 2011-2017, Dec. 2003.
2. A. M. Chugg, R. Jones, M. J. Moutrie, C. S. Dyer, K. A. Ryden, P. R. Truscott, J. R. Armstrong, and D. B. S. King, "Analyses of CCD images of nucleon-silicon interaction events," IEEE Trans. Nucl. Sci., vol. 51, Oct. 2004.
3. G. R. Hopkinson, C. J. Dale, and P. W. Marshall, "Proton effects in charge-coupled devices," IEEE Trans. Nucl. Sci., vol. 43, pp. 614-627, Apr. 1996.
4. I. H. Hopkins and G. R. Hopkinson, "Random telegraph signals from proton-irradiated CCDs," IEEE Trans. Nucl. Sci., vol. 40, no. 6, pp. 2074-2081, Dec. 1993.
5. _, "Further measurements of random telegraph signals in proton irradiated CCDs," IEEE Trans. Nucl. Sci., vol. 42, pp. 2074-2081, Dec. 1995.
6. S. Agostinelli et al., "G4 - a simulation toolkit," Nuc. Instrum. Meth. Phys. Res., vol. A506, no. 3, pp. 250-303, July 1, 2003.
7. C. S. Dyer, C. Comber, P. R. Truscott, C. Sanderson, C. Underwood, M. Oldfield, A. Campbell, S. Buchner, and T. Meehan, "Microdosimetry code simulation of charge-deposition spectra, single-event upsets and multiple-bit upsets," IEEE Trans. Nucl. Sci., vol. 46, pp. 1486-1493, Dec. 1999.
8. C. S. Dyer and P. Lei, "Monte Carlo calculations of the influence on aircraft radiation environments of structures and solar particle events," IEEE Trans. Nucl. Sci., vol. 48, pp. 1987-1995, Dec. 2001.
9. J. R. Srour and R. A. Hartmann, "Effects of single neutron interactions in silicon integrated circuits," IEEE Trans. Nucl. Sci., vol. 32, pp. 4195-4200, Dec. 1985.
10. A. M. Chugg, R. Jones, and M. J. Moutrie, "Broadening of the variance of the number of upsets inb a read-cycle by MBUs," IEEE Trans. Nucl. Sci., vol. 51, pp. 3701-3707, Dec. 2004.