Heavy ion testing and single event upset rate prediction considerations for a DICE flip-flop

IEEE Transactions on Nuclear Science

Volumn 56, Issue 6, 2009, Pages 3130-3137

  Warren, Kevin M ^a   Sternberg, Andrew L ^a   Black, Jeffrey D ^a   Weller, Robert A ^a   Reed, Robert A ^a   Mendenhall, Marcus H ^a   Schrimpf, Ronald D ^a   Massengill, Lloyd W ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

Geant4; MRED; RHBD; SER; SEU

Indexed keywords

CHARGE COLLECTION; CROSS-SECTION MEASUREMENT; HEAVY ION TESTING; LOW FREQUENCY; MONTE CARLO SIMULATION; SEU RATES; SINGLE EVENT UPSETS; SOFTWARE SUITE; SPICE ANALYSIS;

COMPUTER SOFTWARE; ELECTRIC NETWORK ANALYSIS; FLIP FLOP CIRCUITS; HEAVY IONS; SPICE;

URANIUM POWDER METALLURGY;

EID: 72349089021     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2034146     Document Type: Conference Paper

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