Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2506-2511

  Narasimham, Balaji ^a   Bhuva, Bharat L ^a   Schrimpf, Ronald D ^a   Massengill, Lloyd W ^a   Gadlage, Matthew J ^a   Amusan, Oluwole A ^a   Holman, William Timothy ^a   Witulski, Arthur F ^a   Robinson, William H ^a   Black, Jeffrey D ^a   Benedetto, Joseph M ^b   Eaton, Paul H ^c  

^a VANDERBILT UNIVERSITY   (United States)

^b Microelectronics Research and Development Corporation   (United States)

^c NONE   (United States)

Author keywords

CMOS; Combinational logic; DSET; Pulse width; SET; SEU; Single event; Single event transient; Soft error

Indexed keywords

AUTONOMOUS AGENTS; CHARACTERIZATION; COMBINATORIAL CIRCUITS; HEAVY IONS; PROBABILITY; THREE DIMENSIONAL;

EVENT CROSS SECTIONS; SINGLE EVENT TRANSIENT; SINGLE EVENTS; SOFT ERROR;

CMOS INTEGRATED CIRCUITS;

EID: 37249008679     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.910125     Document Type: Conference Paper

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