Transparent PN junction based on tin-antimony oxide films

Wuji Cailiao Xuebao/Journal of Inorganic Materials

Volumn 24, Issue 6, 2009, Pages 1259-1262

  Ji, Zhen Guo ^a,b   Zhou, Rong Fu ^a   Mao, Qi Nan ^b   Huo, Li Juan ^b   Cao, Hong ^b  

^a HANGZHOU DIANZI UNIVERSITY   (China)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

Antimony tin oxide; PN junction; Transparent semiconductive films

Indexed keywords

ANTIMONY OXIDES; ATOMIC RATIO; BAND GAPS; BAND-GAP VALUES; HALL EFFECT MEASUREMENT; HOMOJUNCTION; P-N JUNCTION; P-TYPE; REACTIVE DC MAGNETRON SPUTTERING; RECTIFYING CHARACTERISTICS; SEMICONDUCTIVE; SEMICONDUCTIVE FILMS; THIN LAYERS;

ANTIMONY; DISTILLATION; HALL EFFECT; MAGNETIC FIELD EFFECTS; TIN;

OXIDE FILMS;

EID: 71049143932     PISSN: 1000324X     EISSN: None     Source Type: Journal    
DOI: 10.3724/SP.J.1077.2009.09217     Document Type: Article

References (23)

1. Görrn P, Ghaffari F, Riedl T, et al. Solid-State Electron., 2009, 53(3):329-331.
2. Cheong W S, Ryu M K, Shin J H, et al. Thin Solid Films, 2008, 516(22):8159-8164.
3. Paine D C, Yaglioglu B, Beiley Z, et al. Thin Solid Films, 2008, 516(17):5894-5898.
4. Fortunato E, Barquinha P, Goncalves G, et al. Solid-State Electron., 2008, 52(3):443-448.
5. Wager J F. Thin Solid Films, 2008, 516(8):1755-1764.
6. Logothetidis S, Laskarakis A, Kassavetis S, et al. Thin Solid Films, 2008, 516(7):1345-1349.
7. Kim J H, Ahn B D, Lee C H, et al. Thin Solid Films, 2008, 516(7):1529-1532.
8. Banerjee A N, Nandy S, Ghosh C K, et al. Thin Solid Films, 2007, 515(18):7324- 7330.
9. Barquinha P, Pimentel A, Marques A, et al. J. Non-Cryst. Solids, 2006, 352(9-20):1749-1752.
10. Chiang H Q, Hong D, Hung C M, et al. J. Vac. Sci. Technol. B, 2006, 24(6): 2702-2705.
11. Presley R E, Hong D, Chiang H Q, et al. Solid-State Electron., 2006, 50(3):500-503.
12. Yamamori A, Hayashi S, Koyama T. Appl. Phys. Lett., 2001, 78(21):3343-3345.
13. Gupta A, Compaan A D. Appl. Phys. Lett., 2004, 85(4): 684-686.
14. Liu J Y, Coleman J P. Mater. Sci. Eng. A, 2000, 286(1):144-148.
15. Low H Y, Chua S J. Mater. Lett., 2002, 53(4/5):227-232.
16. Yamamoto T, Katayama-Yoshida H. Japanese Journal of Applied Physics Part 2, 1999, L38(2B): L166-L169.
17. Yamamoto T, Katayama-Yoshida H. Japanese Journal of Applied Physics Part 2, 1997, L36(2B): L180-L183.
18. Yamamoto T, Katayama-Yoshida H. J. Cryst. Growth, 2000, 214-215: 552-555.
19. Ji Z G, Xi J H, Huo L J, et al. Phys. Stat. Sol. (c), 2008, 5(10):3364-3367.
20. Kumar M, Lee BT. Appl. Surf. Sci., 2008, 254(20): 6446-6449.
21. Tang LD, Zhang Y, Yan XQ, et al. Appl. Surf. Sci., 2008, 254(15): 4508-4511.
22. The International Centre for Diffraction Data, PCPDFWIN Version 2.02, May 1999, JCPDS-ICDD, No. PDF#782066 and No. PDF #770452.
23. Jerman M, Qiao Z H, Dieter M. Applied Opt., 2005, 44:3006-3012.