Transparent ring oscillator based on indium gallium oxide thin-film transistors

Solid-State Electronics

Volumn 50, Issue 3, 2006, Pages 500-503

  Presley, R E ^a   Hong, D ^a   Chiang, H Q ^a   Hung, C M ^a   Hoffman, R L ^b   Wager, J F ^a  

^a OREGON STATE UNIVERSITY   (United States)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

Indium gallium oxide; Inverter; Ring oscillator; Thin film transistor; Transparent electronics

Indexed keywords

ELECTRIC LOADS; ELECTROMAGNETIC WAVES; ELECTRON MOBILITY; OPACITY; PHOTOLITHOGRAPHY; THIN FILM TRANSISTORS;

INDIUM GALLIUM OXIDE; LOAD TRANSISTOR; RING OSCILLATOR; TRANSPARENT ELECTRONICS;

OSCILLATORS (ELECTRONIC);

EID: 33646078332     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2006.02.004     Document Type: Article

References (17)

1. Masuda S., Kitamura K., Okumura Y., Miyatake S., Tabata H., and Kawai T. J Appl Phys 93 (2003) 1624
2. Hoffman R.L., Norris B.J., and Wager J.F. Appl Phys Lett 82 (2003) 733
3. Nomura K., Ohta H., Ueda K., Kamiya T., Hirano M., and Hosono H. Science 300 (2003) 1269
4. Carcia P.F., McLean R.S., Reily M.H., and Nunes G. Appl Phys Lett 82 (2003) 1117
5. Nishii J., Hossain F.M., Takagi S., Aita T., Saikusa K., Ohmaki Y., et al. Jpn J Appl Phys 42 (2003) L347
6. Norris B.J., Anderson J., Wager J.F., and Keszler D.A. J Phys: D Appl Phys 36 (2003) L105
7. Presley R.E., Munsee C.L., Park C.H., Hong D., Wager J.F., and Kesxler D.A. J Phys: D Appl Phys 37 (2004) 2810
8. Chiang H.Q., Wager J.F., Hoffman R.L., Jeong J., and Keszler D.A. Appl Phys Lett 86 (2005) 013503
9. Dehuff N.L., Kettenring E.S., Hong D., Chiang H.Q., Wager J.F., Hoffman R.L., et al. J Appl Phys 97 (2005) 064505
10. Chiang HQ, Hong D, Hung CM, Presley RE, Wager JF, Park CH, et al. J Vac Sci Technol, submitted for publication.
11. Hoffman R.L. J Appl Phys 95 (2004) 5813
12. Clemens W., Fix W., Ficker J., Knobloch A., and Ullmann A. J Mater Res 19 (2004) 1963
13. Lin Y.Y., Dodabalapur A., Sarpeshkar R., Bao Z., Li W., Baldwin K., et al. Appl Phys Lett 74 (1999) 2714
14. Knobloch A., Manuelli A., Bernds A., and Clemens W. J Appl Phys 96 (2004) 2286
15. Gelinck G.H., Geuns T.C.T., and de Leeuw D.M. Appl Phys Lett 77 (2000) 1487
16. Cava R., Philips J., Kwo J., Thomas G.A., van Dover R.B., and Carter S.A. Appl Phys Lett 64 (1994) 2071
17. T, and overlap capacitances) employed in the simulation correspond to ring oscillator test structure.