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Volumn , Issue , 2009, Pages 461-466

Emerging lead-free, high-temperature die-attach technology enabled by low-temperature sintering of nanoscale silver pastes

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE POWER ELECTRONICS; CHIP AREAS; CHIP JUNCTIONS; DIE-ATTACH APPLICATIONS; HIGH-TEMPERATURE DIE-ATTACH; HIGHER TEMPERATURES; JOINING TECHNOLOGY; LEAD-FREE; LOW TEMPERATURES; LOW-TEMPERATURE SINTERING; NANOSCALE SILVER PASTE; POWER ELECTRONICS MODULES; QUASI-STATIC PRESSURE; ROHS COMPLIANCE; SILVER PASTES; SINTERING TEMPERATURES; THERMOMECHANICAL PROPERTIES;

EID: 70449846183     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2009.5270709     Document Type: Conference Paper
Times cited : (27)

References (13)
  • 2
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    • Schulze, E., C. Mertens, and A. Lindemann, "Low Temperature Joining Technique - a Solution for Automotive Power Electronics," in PCIM, 2009, Nurnberg, Germany.
  • 4
    • 33748585230 scopus 로고    scopus 로고
    • Low-Temperature Sintered Nanoscale Silver as a Novel Semiconductor Device-Metallized Substrate Interconnect Material
    • Bai, J.G., Z. Z. Zhang, J. N. Calata, and G-Q. Lu, "Low-Temperature Sintered Nanoscale Silver as a Novel Semiconductor Device-Metallized Substrate Interconnect Material," IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 3 (2006), pp. 589-593.
    • (2006) IEEE Transactions on Components and Packaging Technologies , vol.29 , Issue.3 , pp. 589-593
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  • 5
    • 33750841291 scopus 로고    scopus 로고
    • Thermomechanical Reliability of Low-Temperature Sintered Silver Die-Attached SiC Power Device Assembly
    • Bai, J.G., and G-Q. Lu, "Thermomechanical Reliability of Low-Temperature Sintered Silver Die-Attached SiC Power Device Assembly," IEEE Trans. on Device and Materials Reliability,Vol. 6, No. 3 (2006), pp. 436-441.
    • (2006) IEEE Trans. on Device and Materials Reliability , vol.6 , Issue.3 , pp. 436-441
    • Bai, J.G.1    Lu, G.-Q.2
  • 6
    • 58149299812 scopus 로고    scopus 로고
    • Sintered nanosilver paste for high-temperature power semiconductor device attachment
    • Calata, J.N., T. G. Lei, and G-Q. Lu, "Sintered nanosilver paste for high-temperature power semiconductor device attachment," Int. J. Materials and Product Technology, Vol. 34, No. 1/2 (2009), pp. 95-110.
    • (2009) Int. J. Materials and Product Technology , vol.34 , Issue.1-2 , pp. 95-110
    • Calata, J.N.1    Lei, T.G.2    Lu, G.-Q.3
  • 9
    • 34848862467 scopus 로고    scopus 로고
    • Low-Temperature Sintering with Nano-Silver Paste in Die-Attached Interconnection
    • Wang, T., X. Chen, G-Q. Lu, and G-Y. Lei, "Low-Temperature Sintering with Nano-Silver Paste in Die-Attached Interconnection," Journal of Electronic Materials, Vol. 36, No. 10 (2007), pp. 1333-1340.
    • (2007) Journal of Electronic Materials , vol.36 , Issue.10 , pp. 1333-1340
    • Wang, T.1    Chen, X.2    Lu, G.-Q.3    Lei, G.-Y.4
  • 10
    • 0029292098 scopus 로고
    • Constrained-Film Sintering of a Gold Circuit Ink
    • Choe, J.W., J.N. Calata, and G-Q. Lu, "Constrained-Film Sintering of a Gold Circuit Ink," J. Mater. Res., Vol. 10, No. 4 (1995), pp. 986-994.
    • (1995) J. Mater. Res , vol.10 , Issue.4 , pp. 986-994
    • Choe, J.W.1    Calata, J.N.2    Lu, G.-Q.3
  • 11
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    • Wang, T., G. Lei, G-Q. Lu, X. Chen, and L. Guido, Improved Thermal Performance of High-Power LED by Using Low-temperature Sintered Chip Attachment, in 2009 ICEP-HDP, 2009, Beijing, China.
    • Wang, T., G. Lei, G-Q. Lu, X. Chen, and L. Guido, "Improved Thermal Performance of High-Power LED by Using Low-temperature Sintered Chip Attachment," in 2009 ICEP-HDP, 2009, Beijing, China.
  • 13
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    • Tensile Behaviors and Ratcheting Effects of Partially Sintered Chip-Attachment Films of a Nanoscale Silver Paste
    • Chen, X., R. Li, K. Qi, and G-Q. Lu, "Tensile Behaviors and Ratcheting Effects of Partially Sintered Chip-Attachment Films of a Nanoscale Silver Paste," J. of Electronic Materials, Vol. 37, No. 10 (2008), pp. 1574-1579.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.