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Volumn , Issue , 2007, Pages

Low-temperature and pressureless sintering technology for high-performance and hightemperature interconnection of semiconductor devices

Author keywords

[No Author keywords available]

Indexed keywords

LOW TEMPERATURE EFFECTS; NANOPARTICLES; SEMICONDUCTOR DEVICES; SILICON CARBIDE; SILVER; THERMODYNAMIC PROPERTIES;

EID: 36348964807     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESIME.2007.360066     Document Type: Conference Paper
Times cited : (61)

References (19)
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    • Johnson, R.W.1    Palmer, M.2    Wang, C.3    Liu, Y.4
  • 5
    • 0036768050 scopus 로고    scopus 로고
    • Silver-Indium Joints Produced at Low Temperature for High Temperature Devices
    • Chuang, R.W., and C. C. Lee, Silver-Indium Joints Produced at Low Temperature for High Temperature Devices. IEEE Transactions on Components and Packaging Technologies, 2002, 25(3); p. 453-458.
    • (2002) IEEE Transactions on Components and Packaging Technologies , vol.25 , Issue.3 , pp. 453-458
    • Chuang, R.W.1    Lee, C.C.2
  • 6
    • 0003689862 scopus 로고
    • Massalski, T.B, ed, 2nd Edition ed, ASM International; Materials Park, OH
    • Massalski, T.B., ed. Binary Alloy Phase Diagrams. 2nd Edition ed., 1990, ASM International; Materials Park, OH. 34.
    • (1990) Binary Alloy Phase Diagrams , pp. 34
  • 9
    • 0036826433 scopus 로고    scopus 로고
    • Pressure-Assisted Low Temperature Sintering of Silver Paste as an Alternative Die-Attach Solution to Solder Reflow
    • Zhang, Z., and G-Q. Lu, Pressure-Assisted Low Temperature Sintering of Silver Paste as an Alternative Die-Attach Solution to Solder Reflow. IEEE Transactions on Electronics Packaging Manufacturing, 2002. 25(4): p. 279-283.
    • (2002) IEEE Transactions on Electronics Packaging Manufacturing , vol.25 , Issue.4 , pp. 279-283
    • Zhang, Z.1    G-Q, L.2
  • 11
    • 33750841291 scopus 로고    scopus 로고
    • Thermomechanical Reliability of Low-Temperature Sintered Silver Die-Attached SiC Power Device Assembly
    • Bai, J.G., and G-Q. Lu, Thermomechanical Reliability of Low-Temperature Sintered Silver Die-Attached SiC Power Device Assembly. IEEE Trans. on Device and Materials Reliability, 2006. 6(3): p. 436-441.
    • (2006) IEEE Trans. on Device and Materials Reliability , vol.6 , Issue.3 , pp. 436-441
    • Bai, J.G.1    G-Q, L.2
  • 12
    • 33748585230 scopus 로고    scopus 로고
    • Low-Temperature Sintered Nanoscale Silver as a Novel Semiconductor Device-Metallized Substrate Interconnect Material
    • Bai, J.G., Z. Z. Zhang, J. N. Calata, and G-Q. Lu, Low-Temperature Sintered Nanoscale Silver as a Novel Semiconductor Device-Metallized Substrate Interconnect Material. IEEE Transactions on Components and Packaging Technologies 2006. 29(3): p. 589-593.
    • (2006) IEEE Transactions on Components and Packaging Technologies , vol.29 , Issue.3 , pp. 589-593
    • Bai, J.G.1    Zhang, Z.Z.2    Calata, J.N.3    Lu, G.-Q.4
  • 17
    • 36349019415 scopus 로고    scopus 로고
    • Hwang, J.S., ed. Chapter Six: Solder technologies for electronic packaging and assembly. 3rd Edition ed. Electronic Packaging and Interconnection Handbook, ed. C.A. Harper. 2000, McGraw-Hill: New York.
    • Hwang, J.S., ed. Chapter Six: Solder technologies for electronic packaging and assembly. 3rd Edition ed. Electronic Packaging and Interconnection Handbook, ed. C.A. Harper. 2000, McGraw-Hill: New York.
  • 18
    • 0003051289 scopus 로고
    • Conductive adhesives
    • Nguyen, G.P., et al., Conductive adhesives. Circuits Assembly, 1993: p. 36.
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    • Nguyen, G.P.1
  • 19
    • 11344295794 scopus 로고    scopus 로고
    • Elevated temperature aging of solder joints based on Sn-Ag-CuEffects on joint microstructure and shear strength
    • Anderson, I.E., and J.L. Harringa, Elevated temperature aging of solder joints based on Sn-Ag-CuEffects on joint microstructure and shear strength. J. Electron/Mater., 2004. 33: p. 1485.
    • (2004) J. Electron/Mater , vol.33 , pp. 1485
    • Anderson, I.E.1    Harringa, J.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.