An investigation of the distribution of minor components in complex polymeric paint formulations using ToF-SIMS depth profiling

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 436-440

  Hinder, Steven J ^a   Watts, John F ^a   Simmons, Garnett C ^b   Lowe, Chris ^b  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Becker Industrial Coatings Ltd   (United Kingdom)

Author keywords

C60; Depth profiling; Polymeric coatings; ToF SIMS

Indexed keywords

AMINES; CORROSION; DEPTH PROFILING; EPOXY RESINS; FULLERENES; POLYESTERS;

MINOR COMPONENTS; POLYMERIC COATINGS; SECOND PHASE PARTICLES;

PAINT;

EID: 42449133722     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2712     Document Type: Conference Paper

References (4)

1. Hinder SJ, Lowe C, Watts JF. Surf. Interface Anal. 2007; 39:467.
2. Coullerez G, Leonard D, Lundmark S, Mathieu HJ. Surf. Interface Anal. 2000; 29:431.
3. Vickerman JC, Briggs D, Henderson A (eds). The Wiley Static SIMS Library (Version 2), Part 1 - Inorganic Materials. John Wiley: Chichester, 1999; Oxides; 1:3.9.
4. Rattana A, Abel M-L, Watts JF. J. Adhes. 2005; 81:963.