Microcrystalline silicon-carbon alloys as anti-reflection window layers in high efficiency thin film silicon solar cells

Physica Status Solidi - Rapid Research Letters

Volumn 2, Issue 4, 2008, Pages 160-162

  Chen, Tao ^a,b   Huang, Yuelong ^a   Yang, Deren ^b   Carius, Reinhard ^a   Finger, Friedhelm ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBER LAYERS; ANTI-REFLECTION; ANTI-REFLECTION EFFECTS; BACK REFLECTORS; CELL EFFICIENCY; DEPOSITION TIME; HIGH EFFICIENCY; HIGH TRANSPARENCY; HOT WIRE CHEMICAL VAPOR DEPOSITION; LOW SUBSTRATE TEMPERATURE; MICROCRYSTALLINE SILICON-CARBON; THIN-FILM SILICON SOLAR CELLS; WINDOW LAYER;

AMORPHOUS SILICON; CHEMICAL VAPOR DEPOSITION; MICROCRYSTALLINE SILICON; OPTICAL PROPERTIES; SILICON ALLOYS; SILICON CARBIDE; SILICON SOLAR CELLS; SILVER; SOLAR CELLS; SWITCHING CIRCUITS; WINDOWS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 70449497969     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200802119     Document Type: Article

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