Accurate measurement and physical insight: The X-ray extended range technique for fundamental atomic physics, condensed matter research and biological sciences

Radiation Physics and Chemistry

Volumn 79, Issue 2, 2010, Pages 117-123

  Chantler, C T ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

Atomic physics; Integrated techniques; Organometallic chemistry; Synchrotron science; X ray extended range technique; XAFS; XANES; XERT

Indexed keywords

INTEGRATED TECHNIQUES; ORGANOMETALLIC CHEMISTRY; X-RAY EXTENDED RANGE TECHNIQUE; XAFS; XANES; XERT;

ABSORPTION; ATOMS; MOLECULAR BIOLOGY; ORGANOMETALLICS; QUANTUM CHEMISTRY; SOLIDS; SYNCHROTRONS; X RAY ABSORPTION; X RAY ANALYSIS; X RAY CRYSTALLOGRAPHY; X RAYS;

EXPERIMENTS;

ACCURACY; ARTICLE; CRYSTALLOGRAPHY; EQUIPMENT DESIGN; NANOANALYSIS; NUCLEAR PHYSICS; PARTICULATE MATTER; PHONON; RADIATION SCATTERING; RADIOLOGICAL PARAMETERS; RADIOLOGICAL PROCEDURES; SYNCHROTRON; X RAY ABSORPTION FINE TEXTURE; X RAY ABSORPTION NEAR EDGE STRUCTURE; X RAY ANALYSIS; X RAY EXTENDED RANGE TECHNIQUE; X RAY POWDER DIFFRACTION;

EID: 70350746342     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2009.07.022     Document Type: Article

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