Measurement of the x-ray mass attenuation coefficient of silver using the x-ray-extended range technique

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 38, Issue 1, 2005, Pages 89-107

  Tran, C Q ^a   Chantler, C T ^a   Barnea, Z ^a   De Jonge, M D ^a   Dhal, B B ^a   Chung, C T Y ^a   Paterson, D ^b   Wang, J ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG CELLS; ELECTRON DIFFRACTION; ELECTRON REFLECTION; ELECTRON SCATTERING; ERROR CORRECTION; MONOCHROMATORS; PRISMS; SYNCHROTRON RADIATION; X RAY ANALYSIS;

ATOMIC ELECTRONS; INNER-SHELL ELECTRONS; MASS ATTENUATION COEFFICIENTS; X-RAY-EXTENDED RANGE TECHNIQUE (XERT);

SILVER;

EID: 12344266607     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/38/1/009     Document Type: Article

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