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Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 286, Issue 5, 2001, Pages 338-346

X-ray extended-range technique for precision measurement of the x-ray mass attenuation coefficient and Im(f) for copper using synchrotron radiation

(5) Chantler, C T a Tran, C Q a Paterson, D a Cookson, D b,c Barnea, Z a

a UNIVERSITY OF MELBOURNE (Australia)

b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION (Australia)

c ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ATOMS; COPPER; SYNCHROTRON RADIATION; SYNCHROTRONS;

ACCURATE MEASUREMENT; ATOMIC FORM FACTORS; DIRECT CALIBRATION; MASS ATTENUATION COEFFICIENTS; PRECISION MEASUREMENT; THEORETICAL CALCULATIONS; X-RAY MASS ATTENUATION; X-RAY-EXTENDED RANGE TECHNIQUES;

X RAYS;

COPPER;

ACCURACY; ARTICLE; CALCULATION; CHEMICAL ANALYSIS; ENERGY; SYNCHROTRON; THEORY; X RAY ANALYSIS;

EID: 0037578413 PISSN: 03759601 EISSN: None Source Type: Journal
DOI: 10.1016/S0375-9601(01)00444-3 Document Type: Article

Times cited : (51)

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