Measurement of the x-ray mass attenuation coefficient and the imaginary part of the form factor of silicon using synchrotron radiation

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 67, Issue 4, 2003, Pages 427161-4271612

  Tran, C Q ^a   Chantler, C T ^a   Barnea, Z ^a   Paterson, D ^b   Cookson, D J ^c,d  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTROMAGNETIC WAVE ATTENUATION; MICROPROCESSOR CHIPS; PHOTOELECTRICITY; SYNCHROTRON RADIATION; X RAYS;

MASS ATTENUATION COEFFICIENT;

SILICON;

EID: 3242882726     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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