Resolution of discrepancies of atomic form factors and attenuation coefficients in the near-edge soft X-ray regime

Radiation Physics and Chemistry

Volumn 55, Issue 3, 1999, Pages 231-237

  Chantler, C T ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; CRYSTALLOGRAPHY; MEDICINE; PHOTOELECTRICITY; RADIATION PROTECTION;

NEAR-EDGE SOFT X-RAYS; PHOTOELECTRIC ATTENUATION COEFFICIENT; X-RAY ATOMIC FORM FACTORS;

X RAYS;

HELIUM;

ARTICLE; ATOMIC ABSORPTION; CALCULATION; ELECTRON SPIN RESONANCE; QUANTUM MECHANICS; RADIATION ATTENUATION; RADIATION PHYSICS; RADIATION SCATTERING; VARIANCE; X RAY;

EID: 0033166655     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-806X(98)00345-4     Document Type: Article

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