Monitoring fluctuations at a synchrotron beamline using matched ion chambers: 1. Modelling, data collection, and deduction of simple measures of association

X-Ray Spectrometry

Volumn 29, Issue 6, 2000, Pages 449-458

  Chantler, C T ^a   Tran, C Q ^a   Paterson, D ^a   Barnea, Z ^a   Cookson, D J ^b,c  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SOURCES; IONIZATION CHAMBERS; STATISTICS; X RAY DETECTORS;

ASSOCIATED ELECTRONICS; DATA COLLECTION; HIGH-ACCURACY; MEASURES OF ASSOCIATION; MODELING DATA; ORDERS OF MAGNITUDE; SIMPLE++; SYNCHROTRON BEAMLINES; TEMPORAL CHARACTERISTICS; X-RAY SOURCES;

UNCERTAINTY ANALYSIS;

EID: 0034357583     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/1097-4539(200011/12)29:6<449::AID-XRS452>3.0.CO;2-R     Document Type: Article

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